بِسْمِ اللَّهِ الرَّحْمَنِ الرَّحِيمِ

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Atomic Force Microscopy for Energy Research, Cai Shen, 9781032004075, 978-1032004075, 9781003174042, 978-1003174042

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سال انتشار: ۲۰۲۲
زبان کتاب: انگلیسی
فرمت فایل: PDF

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Atomic force microscopy (AFM) can be used to analyze and measure the  physical properties of all kinds of materials at nanoscale in the  atmosphere, liquid phase, and ultra-high vacuum environment. It has  become an important tool for nanoscience research. In this book, the  basic principles of functional AFM techniques and their applications in  energy materials—such as lithium-ion batteries, solar cells, and other  energy-related materials—are addressed